Ophir NanoScan 2s Ge Detector Laser Beam Profiler 9mm Aperture 5um Slit NIR

Ophir NanoScan 2s Ge Detector Laser Beam Profiler 9mm Aperture 5um Slit NIR: Slit-Scanning Beam Profiling for NIR CW and Pulsed Lasers

The Ophir NanoScan 2s Ge Detector Laser Beam Profiler 9mm Aperture 5um Slit NIR is a slit-scanning laser beam profiler built with a germanium detector for near-infrared measurements from 700 to 1800 nm. Designed for photonics engineers, laser manufacturers, and metrology labs, it characterizes beam size, position, and profile on CW and high-repetition-rate pulsed sources across an exceptionally wide 10 nW to 10 W power range without external attenuators.

Key Features and Benefits of the Ophir NanoScan 2s Ge Detector Laser Beam Profiler 9mm Aperture 5um Slit NIR

• 700 to 1800 nm wavelength range — Germanium detector covers the full NIR spectrum for telecom, medical, industrial, and scientific laser applications from a single scanhead.
• 5 µm slit resolution — Fine slit dimension resolves small beam features and supports accurate profiling on beams as narrow as 20 µm.
• 20 µm to ~6 mm beam size range — Handles everything from tightly focused laser spots to wide collimated beams without changing hardware.
• 5.3 nm to 18.3 µm spatial sampling resolution — Sub-wavelength sampling at low scan rates produces high-fidelity beam profiles for research-grade measurements.
• Selectable 1.25 to 20 Hz scan frequencies — Slower scans for maximum resolution on stable beams; faster scans for real-time alignment and tuning workflows.
• 10 nW to 10 W power range — Nine orders of magnitude of dynamic range covers low-level alignment work and high-power industrial laser characterization from one instrument.
• CW and pulsed source support (>25 kHz) — Compatible with continuous-wave lasers and high-repetition-rate pulsed sources without special triggering.
• USB 2.0 interface — Direct connection to a host PC eliminates the need for a separate controller or frame grabber.
• Compact scanhead — 76.8 mm × 63.5 mm cylindrical form factor and 434 g weight make it easy to integrate into constrained optical setups.

Advanced Capabilities

The slit-scanning architecture is what separates the NanoScan 2s from CCD- or CMOS-based beam profilers for high-power NIR work. A CCD sensor saturates or is damaged at power levels well below what industrial lasers produce, forcing the user to add calibrated attenuators that introduce wavelength-dependent errors and reflections. The NanoScan uses a rotating drum with narrow slits that sample the beam mechanically, so only a tiny fraction of the total beam power reaches the germanium detector at any moment. This is what allows a single instrument to profile beams from 10 nW alignment sources up to 10 W industrial lasers without attenuation.

The germanium detector choice is specifically matched to the 700–1800 nm NIR range where silicon-based CCD sensors have poor or no response. Germanium's spectral response extends well past silicon's 1100 nm cutoff, covering the entire telecom C- and L-bands, the 1310 nm datacom wavelength, and the 1064 nm Nd:YAG line — the workhorse wavelengths for fiber lasers, medical lasers, and LIDAR systems. Combined with the 5 µm slit and 5.3 nm minimum spatial sampling resolution, this makes the NS2s-Ge/9/5-PRO capable of characterizing tightly focused NIR laser spots that lower-resolution profilers would smear into featureless blobs.

Calibration and Quality Assurance

Every Ophir NanoScan 2s Ge Detector Laser Beam Profiler is calibrated prior to shipping to OEM specifications. The order includes a Calibration Certificate, Calibration Label, and full Calibration Data. This means the instrument arrives traceable, audit-ready, and ready to use straight out of the box — no need to schedule a calibration cycle before putting it into service.

Specifications

Specification	Value
NanoScan Standard	NS2s-Ge/9/5-PRO
Sensor Type	Germanium
Wavelength Range	700 to 1800 nm
Slit Size	5 µm
Aperture Size	3.5 mm
Scanhead Size	83 mm
Scanhead Dimensions	76.8 mm L × 63.5 mm Ø
Beam Size Range	20 µm to ~6 mm
Spatial Sampling Resolution	5.3 nm to 18.3 µm
Scan Frequency	1.25, 2.5, 5, 10, 20 Hz (selectable)
Compatible Light Sources	CW, Pulsed >25 kHz
Power Range	~10 nW to ~10 W
Bus Interface	USB 2.0
CPU Clock	300 MHz
Memory Clock	264 MHz
Weight	434 g (15.3 ounces)
Operating Temperature	0 to 50 °C
Humidity	90%, non-condensing
Compliance	CE, UKCA, China RoHS