JDSU mTLG-A1C1L1 Dual-Channel C-Band and L-Band Tunable DBR Laser Module

JDSU mTLG-A1C1L1 Dual-Channel C-Band and L-Band Tunable DBR Laser Module

The JDSU mTLG-A1C1L1 is a dual-channel tunable laser module designed for the JDSU MAP-200 Multiple Application Platform. It integrates one C-band tunable laser and one L-band tunable laser into a single plug-in module, providing broad wavelength coverage for advanced optical testing, DWDM system characterization, amplifier evaluation, and photonics research.

The C-band channel tunes from 191.30 THz to 196.10 THz, corresponding to wavelengths from 1528.77 nm to 1567.13 nm. The L-band channel tunes from 186.35 THz to 190.95 THz, corresponding to wavelengths from 1570.01 nm to 1608.76 nm. Together, the two channels provide coverage across two major telecommunications bands without requiring separate single-band modules.

Both channels support wavelength selection on a 25 GHz grid and provide specified wavelength accuracy of ±2 GHz, or approximately ±0.016 nm. Integrated wavelength lockers and automatic power-control loops support stable source operation for precise optical measurements and repeatable automated testing.

The mTLG-A1C1L1 uses polarization-maintaining output fiber with polarization aligned to the slow axis and connector. Supported optical connections use FC/APC interfaces to help reduce back reflection in compatible single-mode fiber systems.

The module requires a compatible MAP-200 chassis for power, local control, module recognition, and automated operation. It cannot function as a standalone tunable laser source.

Features and Benefits of the JDSU mTLG-A1C1L1

• Dual-channel configuration: Integrates one C-band tunable laser and one L-band tunable laser in a single MAP-200 module.
• Broad wavelength coverage: Provides C-band tuning from 1528.77 nm to 1567.13 nm and L-band tuning from 1570.01 nm to 1608.76 nm.
• 25 GHz channel spacing: Supports closely spaced optical channels for DWDM component and transmission testing.
• Precise wavelength control: Provides specified wavelength accuracy of ±2 GHz, approximately ±0.016 nm.
• Stable wavelength output: Delivers typical wavelength stability of ±0.005 nm over 15 minutes and ±0.01 nm over 24 hours under the documented conditions.
• Adjustable optical power: Offers a 7 dBm to 13 dBm setting range for the C-band channel and 7 dBm to 11 dBm for the L-band channel.
• Automatic power control: Helps maintain stable optical output throughout laboratory and production measurements.
• Integrated wavelength lockers: Stabilize the selected wavelength on each tunable laser channel.
• Narrow linewidth: Provides a natural instantaneous linewidth of 5 MHz or less.
• High side-mode suppression: Provides strong spectral separation between the selected output mode and unwanted side modes.
• Polarization-maintaining output: Uses PM fiber aligned to the slow axis and optical connector.
• FC/APC interfaces: Supports low-reflection optical connections for compatible laboratory and production systems.
• MAP-200 automation: Allows wavelength and power settings to be controlled through supported local and remote interfaces.
• High-density test integration: Combines two optical bands in one module to conserve MAP-200 chassis capacity.

One C-Band and One L-Band Tunable Laser

The mTLG-A1C1L1 configuration contains two independently configurable tunable sources. One channel operates in the optical C-band, and the second channel operates in the optical L-band.

This configuration is useful for laboratories and production systems that must test components across both wavelength regions. It eliminates the need to install separate C-band and L-band single-channel modules when two source channels satisfy the application requirements.

Each channel provides its own defined wavelength and output-power range. Test software and MAP-200 controls can select the operating frequency or wavelength and power setting required for the connected device under test.

C-Band Tunable Laser Channel

The C-band channel operates from 191.30 THz to 196.10 THz. In wavelength terms, the tuning range extends from 1528.77 nm to 1567.13 nm.

The C-band channel provides a power-setting range from 7 dBm to 13 dBm. At the maximum setting, output power is specified at greater than 12 dBm.

Its side-mode suppression ratio is specified at 40 dB minimum and 45 dB typical. Relative intensity noise is specified at -140 dB/Hz typical and -135 dB/Hz maximum.

This channel supports C-band DWDM testing, erbium-doped fiber amplifier characterization, filter measurements, multiplexer and demultiplexer testing, receiver evaluation, and other compatible optical applications.

L-Band Tunable Laser Channel

The L-band channel operates from 186.35 THz to 190.95 THz. Its corresponding wavelength range extends from 1570.01 nm to 1608.76 nm.

The L-band channel provides an adjustable power-setting range from 7 dBm to 11 dBm. At the maximum setting, output power is specified at greater than 10 dBm.

Its side-mode suppression ratio is specified at 38 dB minimum and 45 dB typical. Relative intensity noise is specified at -138.5 dB/Hz typical and -133.5 dB/Hz maximum.

This channel is suitable for L-band optical amplifier testing, extended DWDM component evaluation, wavelength-selective device characterization, and long-wavelength transmission experiments.

25 GHz Optical Channel Spacing

Both tunable laser channels support wavelength selection on a 25 GHz frequency grid. This fine channel spacing is suitable for dense wavelength-division multiplexing systems and closely spaced wavelength-selective components.

The operator can select the required channel through the MAP-200 local interface or a supported automation interface. Computer-controlled channel selection supports repeatable wavelength scans, production tests, and component qualification procedures.

The channel plan should be matched to the operating range and design of the device under test. Independent wavelength verification may be performed with a calibrated wavelength meter when formal traceability is required.

Sampled Grating DBR Laser Technology

The mTLG-A1 family uses Sampled Grating Distributed Bragg Reflector laser technology. This electronically tunable semiconductor architecture provides wavelength selection across the supported C-band and L-band ranges.

SGDBR technology allows each channel to replace a group of fixed-wavelength sources in suitable test applications. The selected wavelength can be changed through the MAP-200 platform without physically reconnecting a separate laser.

This supports efficient testing of wavelength-selective components and systems, particularly when measurements must be repeated across many optical channels.

Integrated Wavelength Locking

Each tunable source incorporates wavelength-locking functionality to help maintain the selected optical channel. Stable wavelength operation is important when characterizing narrowband filters, multiplexers, demultiplexers, amplifiers, and other devices whose performance changes significantly with wavelength.

Typical wavelength stability is specified at ±0.005 nm over 15 minutes and ±0.01 nm over 24 hours. These values apply at full power after a one-hour warm-up with the temperature maintained at 25 °C ±3 °C.

System-level stability can also depend on the MAP-200 chassis, ambient conditions, optical connections, PM fiber routing, connector cleanliness, and the stability of the device under test.

Wavelength Accuracy

Wavelength accuracy is specified at ±2 GHz, corresponding to approximately ±0.016 nm. This accuracy supports positioning on the required DWDM channel for laboratory and manufacturing measurements.

The wavelength specification applies after the documented one-hour warm-up, at full output power, and under the stated constant-temperature conditions.

When traceable wavelength measurements are required, each output can be verified using a suitable calibrated wavelength meter or optical spectrum analyzer.

Adjustable Optical Output Power

The C-band channel supports power settings from 7 dBm to 13 dBm, while the L-band channel supports settings from 7 dBm to 11 dBm. Power-setting resolution is typically better than 0.1 dB.

Adjustable output power allows users to characterize devices at different optical input levels. This is useful for amplifier testing, receiver evaluation, component-loss measurements, saturation studies, and system power-budget analysis.

A calibrated optical power meter should be used when independently verified power at the device under test is required. Loss through connectors, patch cords, switches, attenuators, and other components must be considered separately.

Automatic Power Control

The integrated automatic power-control system helps maintain the selected output power. Typical power stability is ±0.005 dB over 15 minutes and ±0.03 dB over 24 hours under the documented operating conditions.

Stable output helps reduce source-related uncertainty during insertion-loss measurements, amplifier-gain measurements, wavelength sweeps, receiver tests, and comparative component characterization.

Power measured at the device under test may still change because of external optical components, connector movement, contamination, polarization alignment, and environmental conditions.

Narrow Linewidth

The natural instantaneous linewidth of both tunable laser channels is specified at 5 MHz or less. Narrow linewidth provides a spectrally controlled optical signal for DWDM and wavelength-selective component testing.

The product specifications note that a self-homodyne measurement may indicate a typical linewidth from 50 MHz to 100 MHz. This difference is related to the measurement method and should be considered when comparing linewidth data from different instruments or procedures.

Suitability for coherent, interferometric, sensing, or other linewidth-sensitive measurements should be evaluated using the linewidth definition and method required by the application.

Side-Mode Suppression Ratio

The C-band channel provides a minimum side-mode suppression ratio of 40 dB and a typical value of 45 dB. The L-band channel provides a minimum SMSR of 38 dB and a typical value of 45 dB.

Side-mode suppression describes the power difference between the selected main optical mode and the strongest unwanted side mode. Strong suppression supports cleaner spectral operation during channelized component and system testing.

Spectral performance can be evaluated with an optical spectrum analyzer capable of providing the required wavelength resolution and dynamic range.

Polarization-Maintaining Fiber

The mTLG-A1C1L1 uses polarization-maintaining fiber. Polarization is aligned to the slow axis and the corresponding optical connector.

PM output is useful for testing components whose insertion loss, gain, transmission, or response changes with polarization. The connected patch cords and external optical path should preserve the required axis alignment when controlled polarization is needed.

PM connector key orientation, fiber stress, connector rotation, adapters, and external components can affect the state of polarization delivered to the device under test.

FC/APC Optical Connections

The supported output connector for the mTLG-A1 is FC/APC. Angled physical-contact connectors reduce optical reflection when properly connected to compatible FC/APC patch cords.

Each connector should be inspected and cleaned before connection. Contamination can reduce delivered power, increase reflection, destabilize measurements, and damage the optical interfaces.

FC/APC and FC/PC connectors should not be directly intermated because their ferrule geometries are different. Compatible PM FC/APC patch cords should be used when polarization alignment must be preserved.

DWDM Component Testing

The combined C-band and L-band outputs make the mTLG-A1C1L1 suitable for broad DWDM component testing. The module can stimulate optical filters, multiplexers, demultiplexers, switches, splitters, couplers, attenuators, wavelength blockers, and other optical devices at selected channels.

Automated testing can step one or both sources across their supported channel grids while power meters, optical spectrum analyzers, or other instruments record component response.

The two-channel architecture may also support comparative measurements, simultaneous dual-wavelength testing, or separate C-band and L-band test paths, depending on the external system configuration.

Optical Amplifier Evaluation

The C-band channel can support testing of compatible C-band erbium-doped fiber amplifiers, while the L-band channel can support testing of compatible L-band amplifier systems.

Measurements may include wavelength-dependent gain, output power, gain flatness, saturation behaviour, and stability. Additional optical attenuators, switches, couplers, spectrum analyzers, and power meters may be required for a complete amplifier test system.

The optical power applied to each device and measurement instrument must remain within its supported input range.

Fiber Characterization

The mTLG-A1C1L1 can provide controlled C-band and L-band optical signals for testing fibers, cable assemblies, connectors, splices, and other transmission paths.

A tunable source can be stepped through the supported wavelengths while a compatible optical power meter measures transmitted power. This allows wavelength-dependent insertion loss or transmission response to be evaluated across both bands.

Specialized parameters such as chromatic dispersion, polarization-mode dispersion, and full spectral attenuation require additional compatible measurement equipment.

Transmitter and Receiver Testing

The module can provide controlled optical stimuli for receiver and subsystem testing. Adjustable wavelength and output power allow compatible receivers to be evaluated at different DWDM channels and optical levels.

An external programmable attenuator may be used to reduce the source output to receiver sensitivity levels. Optical switches can route either channel to several devices under test in automated production or qualification systems.

Additional modulation equipment may be required when the receiver test requires a data-bearing or high-speed modulated optical signal.

Typical Applications

• C-band and L-band DWDM transmission testing
• Optical amplifier testing
• Dual-band tunable laser grids
• Wavelength-selective component characterization
• Optical filter testing
• Multiplexer and demultiplexer evaluation
• Optical switch and attenuator testing
• Fiber and cable assembly characterization
• Transmitter and receiver testing
• Optical power and insertion-loss measurements
• Automated photonics production testing
• MAP-200 modular test-system integration

Product Overview

Brand	JDSU
Model	mTLG-A1C1L1
Product Family	mTLG-A1 MAP Tunable DBR Laser
Product Category	Dual-Channel C-Band and L-Band Tunable Laser Module
Channel Configuration	One C-band tunable laser and one L-band tunable laser
Compatible Platform	JDSU MAP-200 Multiple Application Platform
Channel Spacing	25 GHz
Output Fiber	Polarization-maintaining fiber
Optical Connector	FC/APC
Primary Application	Dual-band tunable optical source generation for DWDM and photonics testing

 

Wavelength Specifications

Specification	C-Band Channel	L-Band Channel
Frequency Range	191.30 THz to 196.10 THz	186.35 THz to 190.95 THz
Wavelength Range	1528.77 nm to 1567.13 nm	1570.01 nm to 1608.76 nm
Channel Spacing	25 GHz	25 GHz
Wavelength Accuracy	±2 GHz, approximately ±0.016 nm	±2 GHz, approximately ±0.016 nm
Typical 15-Minute Stability	±0.005 nm	±0.005 nm
Typical 24-Hour Stability	±0.01 nm	±0.01 nm

 

Optical Power Specifications

Specification	C-Band Channel	L-Band Channel
Power-Setting Range	7 dBm to 13 dBm	7 dBm to 11 dBm
Power at Maximum Setting	Greater than 12 dBm	Greater than 10 dBm
Typical Setting Resolution	Better than 0.1 dB	Better than 0.1 dB
Typical 15-Minute Stability	±0.005 dB	±0.005 dB
Typical 24-Hour Stability	±0.03 dB	±0.03 dB

 

Spectral Specifications

Specification	C-Band Channel	L-Band Channel
Laser Technology	Sampled Grating Distributed Bragg Reflector	Sampled Grating Distributed Bragg Reflector
Natural Instantaneous Linewidth	5 MHz or less	5 MHz or less
Minimum SMSR	40 dB	38 dB
Typical SMSR	45 dB	45 dB
Typical Relative Intensity Noise	-140 dB/Hz	-138.5 dB/Hz
Maximum Relative Intensity Noise	-135 dB/Hz	-133.5 dB/Hz

 

Optical Interface and General Specifications

Specification	Details
Output Fiber	Polarization-maintaining fiber
Polarization Alignment	Aligned to the slow axis and optical connector
Supported Connector	FC/APC
Required Warm-Up Time	One hour
Operating Temperature	10 °C to 40 °C
Operating Humidity	Less than 80% relative humidity from 10 °C to 40 °C, non-condensing
Dimensions	4.06 cm high x 13.26 cm wide x 37.03 cm deep
Maximum Weight	Approximately 1.3 kg or 2.95 lb, varying with configuration

 

Documented mTLG-A1 Module Configurations

Product Code	Description
mTLG-A1C10	C-band single-laser module
mTLG-A1C20	C-band dual-density module
mTLG-A1C40	C-band quad-density module
mTLG-A1L10	L-band single-laser module
mTLG-A1L20	L-band dual-density module
mTLG-A1L40	L-band quad-density module
mTLG-A1C1L1	One C-band channel and one L-band channel in a dual-density module

 

MAP-200 Platform Requirements

The mTLG-A1C1L1 must be installed in a compatible JDSU MAP-200 chassis. The chassis supplies operating power, module communication, user controls, and access to supported automation interfaces.

Compatibility should be confirmed using the chassis model, firmware revision, controller configuration, available slots, and supported module database. A module installed without a compatible chassis cannot operate independently.

The listing should identify whether the MAP-200 chassis, controller, network interface, optical patch cords, software, drivers, and other modules are included.

Operating and Connection Considerations

The module requires a one-hour warm-up before the documented wavelength and power accuracy or stability specifications apply. The stated values assume full-power operation and a temperature maintained at 25 °C ±3 °C.

Both FC/APC connectors and the corresponding PM patch cords should be inspected and cleaned before use. Proper connector-key orientation should be maintained when polarization alignment is important.

The output of each laser channel should be connected only to equipment capable of accepting the configured optical power. External attenuation may be necessary before connecting sensitive photodiodes, receivers, or low-power measurement instruments.

Wavelength, output power, connector assignment, and optical path should be verified independently for each channel before automated testing begins.

Comprehensive Functional and Performance Testing

The JDSU mTLG-A1C1L1 receives comprehensive functional and performance testing before shipment. Evaluation may include installation in a compatible MAP-200 chassis, module recognition, C-band channel operation, L-band channel operation, source enable and disable, wavelength selection, power adjustment, and supported communication functions.

Optical testing may include wavelength verification at representative C-band and L-band channels, output-power measurements, tuning response, short-term wavelength stability, short-term power stability, wavelength-locker operation, and spectral evaluation when suitable calibrated equipment is available.

Both FC/APC interfaces, the module-to-chassis connector, front panel, retaining hardware, cooling surfaces, enclosure, model label, and serial-number label may be inspected for contamination, damage, or excessive wear.

The exact test scope depends on the available MAP-200 chassis, firmware compatibility, calibrated wavelength meter, optical power meter, optical spectrum analyzer, PM patch cords, and requested C-band and L-band test points.

Calibration Before Shipment

When technically applicable and selected, the JDSU mTLG-A1C1L1 can be calibrated or performance-verified before shipment. Calibration may include wavelength accuracy, output power, power-setting response, wavelength stability, power stability, and spectral performance for both tunable laser channels.

Calibration should use compatible traceable standards, including a calibrated wavelength meter, optical power meter, and optical spectrum analyzer where required. Test documentation should identify the MAP-200 chassis, module serial number, firmware, connector interfaces, frequencies, wavelengths, optical power settings, recorded results, and measurement uncertainty.

Buyers requiring formal calibration should specify the desired C-band and L-band wavelengths, optical power levels, number of tested channels, certificate type, recorded values, and required measurement uncertainty before purchase.

Buyer Considerations

Buyers should confirm the complete model as JDSU mTLG-A1C1L1. This product code identifies a dual-density module containing one C-band tunable laser and one L-band tunable laser.

The module requires a compatible MAP-200 chassis. Chassis firmware, available slots, controller operation, automation interfaces, and module recognition should be verified before purchase.

The condition of both FC/APC output connectors, PM fiber interfaces, chassis connector, faceplate, retaining hardware, enclosure, labels, and calibration records should be reviewed.

Only the tunable laser module, MAP-200 chassis, PM FC/APC patch cords, optical attenuators, network cables, software, drivers, manuals, calibration records, and accessories specifically identified in the product listing should be considered included.

Why Buy from AssetRelay?

AssetRelay supplies professional equipment and product solutions for fiber optics, telecom, laboratory, production, optical testing, tunable laser systems, photonics, electronic testing, RF/microwave, inspection, and technical research applications. The JDSU mTLG-A1C1L1 provides combined C-band and L-band wavelength generation for DWDM component manufacturers, amplifier developers, telecommunications laboratories, production facilities, system integrators, universities, and research organizations.

Buyers should review the product photographs, complete model label, MAP-200 compatibility, both FC/APC connector interfaces, PM fiber requirements, C-band and L-band tuning operation, output power, firmware compatibility, calibration status, functional test results, and included accessories before purchase.