VIAVI mSWS-A2S0M Dual-Output Integrated Source Optics Module for MAP Swept Wavelength Systems

VIAVI mSWS-A2S0M Dual-Output Integrated Source Optics Module

The VIAVI mSWS-A2S0M is the dual-output integrated Source Optics Module for the MAP-based mSWS-A2 Swept Wavelength System. It provides essential source-side optical functions for swept-wavelength characterization of advanced fiber optic components, photonic modules, and optical circuit packs across the C-band and L-band.

The mSWS-A2 platform measures insertion loss, polarization-dependent loss, and related spectral characteristics as a function of wavelength. Return loss measurements are also supported when the system is equipped with the required optional ORL hardware. The Source Optics Module works with the mSWS tunable laser, MAP-based receiver hardware, detector modules, telemetry components, and application software as part of a complete swept-wavelength measurement system.

The documented mSWS-A2 core-system part number is mSWS-A2S0M, with a zero in “S0M.” It is described as a dual-output integrated Source Optics Module. The abbreviated designation mSWS-A2SOM may be used informally, but mSWS-A2S0M is the documented part number.

The module incorporates a four-state polarization controller for rapid measurement of polarization-dependent loss and average insertion loss. It applies polarization states at 0°, 90°, -45°, and circular polarization, allowing the mSWS software to determine PDL across the scanned wavelength range through Mueller matrix analysis.

Features and Benefits of the VIAVI mSWS-A2S0M

• Dual-output Source Optics Module: Provides two integrated source-side optical outputs for the mSWS-A2 swept-wavelength test architecture.
• Complete C-band and L-band support: Works within the mSWS-A2 operating range from 1520.086 nm to 1630 nm.
• Four-state polarization control: Applies 0°, 90°, -45°, and circular polarization states for PDL characterization.
• Mueller matrix analysis: Supports analytical calculation of polarization-dependent loss at every scanned wavelength.
• High-speed swept testing: Supports system sweep rates of 10, 20, 40, and 100 nm/s.
• High wavelength accuracy: The complete mSWS-A2 system provides ±2 pm absolute wavelength accuracy.
• Selectable wavelength resolution: Supports system resolutions of 3 pm, 1.5 pm, 0.75 pm, or 0.4 pm.
• Parallel measurement architecture: Supports simultaneous measurement of connected channels through the distributed mSWS platform.
• Scalable test configuration: The complete system can support multiple individually controlled measurement stations from a shared source laser.
• Component analysis support: Enables measurement and software analysis of loss, center wavelength, bandwidth, crosstalk, and flatness.
• MAP platform integration: Works with the MAP-300 photonics test platform and compatible mSWS receiver hardware.
• Professional manufacturing applications: Supports high-volume testing of multi-port and wavelength-selective optical devices.

Role of the Source Optics Module

The mSWS-A2S0M forms part of the optical source path within the mSWS-A2 measurement architecture. It conditions and distributes the swept optical signal used to characterize the device under test.

The module is not a complete standalone swept-wavelength test system. It operates with the supported mSWS tunable laser, measurement receivers, detector modules, MAP-300 mainframe, software, and associated optical connections.

The dual-output design supports the system’s distributed measurement architecture. This architecture is intended to increase test capacity by allowing a source system to serve multiple measurement resources without requiring a complete source assembly for every test station.

Four-State Polarization Controller

A four-state polarization controller is incorporated within the Source Optics Module. During a measurement sequence, the system applies four independent input polarization states to the connected device under test.

• 0° linear polarization
• 90° linear polarization
• -45° linear polarization
• Circular polarization

The resulting optical measurements are analyzed using the Mueller matrix method to calculate polarization-dependent loss and average insertion loss throughout the scanned wavelength range.

This approach enables rapid PDL characterization without requiring a slow manual search for the maximum and minimum transmitted powers. It is particularly useful for wavelength-selective devices whose polarization behavior varies across the C-band and L-band.

Swept-Wavelength PDL Measurement

Polarization-dependent loss represents the variation in insertion loss produced by changes in the input state of polarization. PDL can affect system margins, channel uniformity, receiver performance, and the predictability of wavelength-selective optical components.

The mSWS-A2S0M supplies the controlled polarization states required for the mSWS system to measure PDL as a function of wavelength. All connected channels can be measured through the system’s parallel architecture.

The complete mSWS-A2 system provides a documented PDL measurement range of 50 dB under the stated conditions. PDL resolution is 0.001 dB. Available measurement range is reduced at higher sweep speeds, and performance depends on the optical power delivered to the device under test.

Insertion Loss and Average Loss Measurements

The mSWS-A2 platform measures insertion loss as a function of wavelength. With the four-state polarization measurement capability, the system can also determine average loss across the applied polarization states.

The documented insertion loss measurement range is 70 dB for a stand-alone station and 60 dB for a distributed measurement station under the specified operating conditions. Insertion loss resolution is 0.001 dB.

Base insertion loss uncertainty is specified at ±0.03 dB before noise and slope-tracking errors under the documented conditions. Measurement performance depends on source power, sweep speed, insertion loss, fiber stability, connector condition, temperature, and the complete system configuration.

1520.086 nm to 1630 nm Wavelength Range

The complete mSWS-A2 system supports swept-wavelength measurements from 1520.086 nm to 1630 nm. This range covers the C-band and L-band regions used by modern optical communications systems and wavelength-selective components.

Broad wavelength coverage allows the system to characterize devices whose optical response extends across one or both telecommunications bands. Compatible applications include ROADMs, wavelength-selective switches, wavelength blockers, DWDM components, tunable filters, couplers, splitters, attenuators, interleavers, and optical circuit packs.

The source laser, Source Optics Module, receiver hardware, test fibers, connectors, and detector modules must remain compatible with the complete measurement range required by the application.

High-Speed Optical Sweeps

The mSWS-A2 supports system sweep rates of 10, 20, 40, and 100 nm/s. The system maintains its documented wavelength performance at sweep rates up to 100 nm/s.

At the maximum sweep rate, a documented C-band sweep period is approximately 3 seconds, while a combined C-band and L-band sweep period is approximately 4 seconds under the stated continuous-scanning conditions.

High-channel-count systems may require additional delay. Measurement software should allow for detector acquisition, optical settling, communication, and the specific number of connected channels.

Selectable Wavelength Resolution

The mSWS-A2 provides user-selectable wavelength resolution at 3 pm, 1.5 pm, 0.75 pm, or 0.4 pm. This allows the measurement configuration to be adjusted according to the spectral detail required by the device under test.

Fine resolution is useful when characterizing narrow passbands, steep filter edges, interleavers, dense channel structures, and wavelength-selective devices with closely spaced spectral features.

The selected resolution, sweep speed, measurement range, channel count, and required test time should be considered together when developing a production or research measurement procedure.

Parallel and Distributed Measurement Architecture

The mSWS architecture measures connected channels in parallel rather than scanning each channel through an individual serial process. This reduces total test time for high-port-count components and modules.

The distributed architecture supports up to eight separate, individually controlled measurement stations for each source laser in a compatible system configuration. This scalability allows equipment initially used for research and development to be expanded for production requirements.

Installed SWS2000 systems may also be expanded with mSWS-A2-based measurement stations where system compatibility and configuration requirements are met.

Software Analysis Capabilities

The mSWS application software uses measured insertion loss and polarization-dependent loss data to calculate additional wavelength-dependent component characteristics.

• Loss at the measured peak
• Center wavelength determined from a selected decibel threshold
• Loss at center wavelength
• Bandwidth at a selected decibel threshold
• Left, right, and cumulative crosstalk
• Passband flatness
• Results relative to a measured peak
• Results relative to an ITU or user-defined wavelength grid

These analysis functions help convert raw spectral measurements into practical component parameters for engineering, production, and quality-control workflows.

Custom Test Development

The mSWS-A2 platform provides data link layers for the development of custom test applications. These software resources communicate through the mSWS receiver hardware and provide access to supported system functions.

Custom applications can be developed for compatible Visual Basic, C, C++, and LabVIEW environments. This allows manufacturers and laboratories to integrate swept-wavelength measurements into specialized automation systems and internal data-management workflows.

Software availability, license status, operating-system compatibility, drivers, and communication interfaces should be verified for the installed system.

Typical Applications

• Colorless, directionless, and contentionless ROADM testing
• Wavelength-selective switch characterization
• Wavelength blocker testing
• Optical circuit-pack characterization
• DWDM multiplexer and demultiplexer testing
• Tunable optical filter measurements
• Coupler and splitter characterization
• Optical switch and attenuator testing
• Interleaver spectral analysis
• MEMS and optical waveguide device testing
• Research and development measurements
• High-volume optical manufacturing tests

Product Overview

Brand	VIAVI
Model	mSWS-A2S0M
Product Family	mSWS-A2 MAP Swept Wavelength System
Product Category	Dual-Output Integrated Source Optics Module
Optical Outputs	Dual output
Polarization Controller	Integrated four-state controller
Polarization States	0°, 90°, -45°, and circular polarization
System Wavelength Range	1520.086 nm to 1630 nm
Compatible Platform	MAP-based mSWS-A2 Swept Wavelength System
Primary Application	Source conditioning and polarization control for swept-wavelength IL and PDL measurements

 

System Wavelength Specifications

Specification	Details
Wavelength Range	1520.086 nm to 1630 nm
Absolute Wavelength Accuracy	±2 pm
Selectable Wavelength Resolution	3 pm, 1.5 pm, 0.75 pm, or 0.4 pm
Available Sweep Rates	10, 20, 40, and 100 nm/s

 

Documented System Sweep Periods

Sweep Rate	C-Band Sweep Period	Combined C/L-Band Sweep Period
10 nm/s	8 seconds	15 seconds
20 nm/s	5.5 seconds	9 seconds
40 nm/s	4 seconds	6 seconds
100 nm/s	3 seconds	4 seconds

 

Insertion Loss and PDL System Specifications

Specification	Details
Stand-Alone Station Insertion Loss Range	70 dB
Distributed Station Insertion Loss Range	60 dB
Insertion Loss Base Uncertainty	±0.03 dB before noise or slope error under the documented conditions
Insertion Loss Resolution	0.001 dB
PDL Measurement Range	50 dB under the documented conditions
PDL Resolution	0.001 dB
PDL Measurement Method	Four-state polarization measurement with Mueller matrix analysis

 

mSWS-A2 Core System Components

Component	Part Number
C/L-Band Tunable Laser	mSWS-A2SLS
Dual-Output Integrated Source Optics Module	mSWS-A2S0M
Four-Output Telemetry Transmitter Expansion Module	mSWS-A2TX
Eight-Slot MAP-300 Mainframe	MAP-380
Quad Detector Module	mSWS-A2DM
Telemetry Receiver	mSWS-A2RX
ORL Utility Cassette	mUTL-A1000 with MUTL-A150LR option
PM Fiber Jumper	mSWS-PMJ

 

System Configuration Requirements

The mSWS-A2S0M is a system component rather than an independent source or measuring instrument. Operation requires compatible mSWS source, receiver, detector, mainframe, software, and optical interconnection hardware.

The exact hardware configuration depends on whether the system is arranged as a stand-alone measurement station or a distributed multi-station system. Return loss measurements require the applicable ORL utility cassette and compatible mSWS receiver and detector modules.

System compatibility should be confirmed using the complete part numbers, mainframe model, firmware revisions, application-software version, licenses, detector configuration, telemetry hardware, and optical accessories.

Optical Setup and Connector Care

All optical interfaces and jumpers should be inspected and cleaned before connection. Contamination can introduce wavelength-dependent loss, reflection, instability, and measurement artifacts that may be incorrectly attributed to the device under test.

Fiber connections between the Source Optics Module, tunable laser, receivers, detectors, and device under test should remain mechanically stable throughout reference and measurement sweeps.

Compatible polarization-maintaining and single-mode jumpers should be used where required by the system configuration. Connector family and ferrule polish must match the corresponding optical interfaces.

The system should complete its required startup, referencing, and wavelength-calibration procedures before production or precision measurements begin.

Comprehensive Functional and Performance Testing

The VIAVI mSWS-A2S0M receives comprehensive functional and performance testing before shipment. Evaluation may include installation in a compatible system, module recognition, communication, dual-output operation, polarization-controller sequencing, and interaction with the supported tunable laser and receiver hardware.

Optical testing may include continuity through both outputs, relative output comparison, polarization-state sequencing at 0°, 90°, -45°, and circular polarization, operation across representative C-band and L-band wavelengths, and compatibility with the mSWS swept measurement process.

The optical interfaces, module connectors, faceplate, retaining hardware, labels, enclosure, and associated fibers may be inspected for contamination, damage, excessive wear, or mechanical problems.

The exact test scope depends on the available mSWS tunable laser, MAP mainframe, receiver, detector modules, software, licenses, optical jumpers, wavelength references, and supporting measurement equipment.

Calibration Before Shipment

When technically applicable and selected, the VIAVI mSWS-A2S0M can be calibrated or performance-verified before shipment as part of a compatible mSWS system. Evaluation may include wavelength-path continuity, dual-output response, polarization-state operation, insertion loss contribution, and system measurement repeatability.

System-level calibration may include wavelength accuracy, insertion loss, polarization-dependent loss, receiver response, detector linearity, and applicable return loss functions when the required ORL hardware is installed.

Calibration documentation should identify the Source Optics Module and system serial numbers, tunable laser, MAP mainframe, receivers, detector modules, software version, optical connections, test wavelengths, polarization states, recorded values, and applicable measurement uncertainty.

Buyer Considerations

Buyers should confirm the complete model as VIAVI mSWS-A2S0M. The character between “S” and “M” in the documented model is a zero, not the letter O.

The mSWS-A2S0M does not function as a complete standalone swept-wavelength system. Buyers should verify the availability and compatibility of the tunable laser, MAP mainframe, receiver modules, detector modules, software, licenses, telemetry hardware, polarization-maintaining jumpers, and required optical accessories.

The listing should identify whether optical cables, PM jumpers, mainframes, receivers, detectors, software, licenses, manuals, calibration records, or other mSWS components are included.

Only the Source Optics Module and accessories specifically identified in the product listing should be considered included.

Why Buy from AssetRelay?

AssetRelay supplies professional equipment and product solutions for fiber optic, telecom, laboratory, production, optical testing, photonics, electronic test, RF/microwave, inspection, and technical research applications. The VIAVI mSWS-A2S0M supports optical component manufacturers, telecommunications laboratories, ROADM developers, wavelength-selective switch manufacturers, production facilities, system integrators, universities, and research organizations.

Buyers should review the complete model label, dual-output operation, polarization-controller functionality, optical interface condition, mSWS and MAP platform compatibility, software requirements, calibration status, functional test results, and included system components before purchase.