JDS Uniphase SWS16102 Dual-Output L-Band Swept Wavelength Source Module

JDS Uniphase SWS16102 Dual-Output L-Band Swept Wavelength Source Module

The JDS Uniphase SWS16102 is a dual-output source module designed for the SWS16100 Swept Wavelength System. It supports high-accuracy wavelength-dependent characterization of passive fiber optic components across the extended L-band range from 1541 nm to 1630 nm.

The supplied product name identifies the module as C-band, but the documented JDS Uniphase product structure assigns the SWS151 Series to C-band operation from 1520 nm to 1570 nm and the SWS161 Series to extended L-band operation from 1541 nm to 1630 nm. The SWS16102 should therefore be described as an L-band source module unless the physical unit has a custom configuration documented by its labels or calibration records.

The SWS16102 forms part of a complete swept wavelength measurement system. The overall SWS architecture combines a tunable laser, source optics module, transmitter cabinet, receiver hardware, detector modules, computer interface, application software, and a user-supplied computer. These components work together to measure insertion loss and other wavelength-dependent characteristics of connected optical devices.

The source system provides a narrow-linewidth optical signal that sweeps across the selected wavelength range. The source optics module performs real-time wavelength measurements and transmits the wavelength information to the receiver. At the receiver, part of the optical power is directed to a reference detector while the remaining power passes through the device under test. Comparing the reference and measurement signals enables accurate ratio-based component characterization.

Features and Benefits of the JDS Uniphase SWS16102

• Extended L-band coverage: Supports swept wavelength measurements from 1541 nm to 1630 nm as part of an SWS16100 system.
• Dual-output configuration: Provides two optical outputs for compatible SWS source and receiver arrangements.
• High wavelength accuracy: The complete system provides ±0.003 nm absolute wavelength accuracy.
• Fine wavelength resolution: Supports a documented system wavelength resolution of 0.003 nm.
• Parallel component testing: Enables simultaneous measurement of multiple outputs when used with compatible receiver and detector hardware.
• Scalable channel capacity: A properly expanded SWS system can test up to 128 optical channels simultaneously.
• Distributed system architecture: One transmitter can nominally support up to four independent receiver stations.
• Insertion loss characterization: Measures optical loss across the complete swept wavelength range.
• Spectral parameter analysis: Supports analysis of bandwidth, center wavelength, passband, crosstalk, flatness, and isolation.
• Optional PDL measurements: Supports polarization-dependent loss and average-loss measurements with the compatible four-state polarization controller.
• Production and laboratory use: Designed for both optical component manufacturing and research and development environments.
• Broad device compatibility: Suitable for DWDM devices, filters, gratings, isolators, switches, attenuators, couplers, splitters, and interleavers.

SWS161 L-Band Operation

The SWS16100 system provides wavelength scanning from 1541 nm to 1630 nm. This extended L-band range supports characterization of components developed for long-wavelength optical communication, monitoring, filtering, and signal-routing applications.

The corresponding SWS15100 system covers the C-band from 1520 nm to 1570 nm. When full C-band and L-band coverage is required in one trace, compatible transmitters can be combined through an optional dual-waveband selector switch installed within the appropriate receiver configuration.

The SWS16102 model should not be represented as a C-band-only source module. If the physical instrument is labeled or configured differently from the standard SWS161 structure, the installed wavelength range should be verified by direct optical testing or supporting calibration documentation.

Dual-Output Source Configuration

The SWS16102 is identified as a two-output configuration. The dual outputs support compatible distribution of the swept optical source within the SWS measurement architecture.

The exact output assignments, connector types, optical power levels, and communication with the rest of the system should be confirmed from the individual module and associated transmitter documentation.

The SWS16102 is not a complete two-channel receiver and does not independently measure a device under test. The module must operate with the appropriate tunable laser, source optics, receiver, detector, interface, and software components.

Swept Wavelength Measurement Principle

The SWS system uses a tunable laser to scan a narrow-linewidth signal across the selected wavelength range. The source optics module measures the instantaneous wavelength in real time and transfers this information to the receiver system.

At the receiver, a portion of the optical signal is directed to a reference detector. The remaining optical power passes through the device under test and is measured by one or more detector channels.

The software calculates the ratio between the reference path and the device path. This ratio-based method helps compensate for source-power changes during the wavelength sweep and produces the wavelength-dependent insertion-loss response of the optical component.

High-Accuracy Wavelength Measurements

The documented SWS platform provides absolute wavelength accuracy of ±0.003 nm and wavelength resolution of 0.003 nm. This level of performance supports detailed characterization of narrowband and wavelength-selective optical devices.

Fine wavelength resolution is useful for identifying center wavelength, passband width, steep filter edges, spectral ripple, channel isolation, and adjacent-channel crosstalk.

System-level wavelength accuracy depends on the complete hardware configuration, calibration condition, gas-cell reference where applicable, software, fiber connections, environmental conditions, and measurement procedure.

Insertion Loss Measurements

The SWS measures insertion loss as a function of wavelength. Instead of measuring only at one or two fixed wavelengths, the system records the complete spectral transmission response of the connected device.

The documented dynamic range for loss measurements is greater than 50 dB when the optical power applied to the device under test is greater than -15 dBm.

Loss measurement accuracy is specified at ±0.1 dB for device loss from 0 dB to less than 20 dB. Accuracy is ±0.2 dB from 20 dB to less than 40 dB and ±0.3 dB from 40 dB to less than 50 dB under the documented conditions.

Parallel Multi-Channel Measurements

A major advantage of the SWS architecture is its ability to measure multiple outputs of an optical component simultaneously. This capability is particularly valuable for high-channel-count multiplexers, demultiplexers, splitters, switches, and other multi-port devices.

Each standard receiver is configured with one control module and one dual-detector module. Compatible additional receiver chassis and detector modules allow an expanded system to measure up to 128 channels at the same time.

As component output count increases, parallel acquisition can significantly reduce the average test time per channel compared with conventional systems that test each output sequentially.

Distributed Measurement Architecture

The SWS uses a distributed architecture in which one source transmitter can serve multiple receiver stations. A single transmitter can nominally support four independent receivers in a compatible system arrangement.

Only one optical fiber is required to connect the transmitter to each receiver station. This arrangement allows the source hardware to be shared across separate test locations or manufacturing stations.

The exact number of supported stations depends on the installed source, source optics module, optical distribution configuration, receivers, detectors, computer interfaces, software, and available optical power.

Optional Polarization-Dependent Loss Measurements

The optional SWS15104 four-state polarization controller enables measurement of polarization-dependent loss and average insertion loss as functions of wavelength.

The controller applies four defined polarization states: linear polarization at 0°, 90°, and -45°, plus circular polarization. The SWS measures insertion loss at each state and calculates PDL using the Mueller matrix method.

The documented measurable PDL range is 0 dB to 5 dB. PDL measurement requires the compatible polarization controller, receiver hardware, detector modules, optical configuration, and application software.

Software Analysis Functions

The SWS application software processes the acquired wavelength and insertion-loss data to calculate practical optical component parameters.

• Insertion loss as a function of wavelength
• Center wavelength
• Optical bandwidth
• Passband response
• Channel crosstalk
• Passband flatness
• Optical isolation
• Polarization-dependent loss with the optional controller
• Average insertion loss with the optional controller

The documented software supports analysis and presentation of data from up to 128 channels. Dynamic link libraries support compatible custom applications developed in LabVIEW, C, C++, or Visual Basic environments.

Typical Applications

• L-band DWDM multiplexer and demultiplexer testing
• Optical bandpass filter characterization
• Fiber Bragg grating measurements
• Optical isolator evaluation
• Optical switch characterization
• Variable optical attenuator testing
• Broadband optical coupler testing
• Optical splitter characterization
• Interleaver spectral analysis
• Wavelength-dependent insertion-loss testing
• Parallel testing of multi-output components
• Optical component manufacturing and research

Product Overview

Brand	JDS Uniphase
Model	SWS16102
Product Family	SWS16100 Swept Wavelength System
Product Category	Dual-Output Swept Wavelength Source Module
Optical Band	Extended L-band
Output Configuration	Two outputs
System Scan Range	1541 nm to 1630 nm
Wavelength Resolution	0.003 nm
Absolute Wavelength Accuracy	±0.003 nm
Primary Application	Swept-wavelength characterization of passive L-band optical components

 

Model Identification

Model Element	Documented Meaning
SWS	Swept Wavelength System
161	Extended L-band system type
02	Two-output system configuration
Corresponding C-Band Series	SWS151 Series

 

System Measurement Specifications

Specification	Details
L-Band Scan Range	1541 nm to 1630 nm
Wavelength Resolution	0.003 nm
Absolute Wavelength Accuracy	±0.003 nm
Simultaneous Channel Capacity	Up to 128 channels with a properly expanded system
Loss Measurement Dynamic Range	Greater than 50 dB with more than -15 dBm applied to the device under test
Slope Accuracy	10 dB/pm across the documented 0 dB to 30 dB loss range

 

Loss Measurement Accuracy

Device Loss Range	Documented Accuracy
0 dB to less than 20 dB	±0.1 dB
20 dB to less than 40 dB	±0.2 dB
40 dB to less than 50 dB	±0.3 dB

 

Documented L-Band Scan Time

Computer Interface	L-Band Scan Time
Optional Data Acquisition Card	8 seconds plus 2 seconds per measured channel
Parallel Port Interface	8 seconds plus 3 seconds per measured channel

 

Source Optics Module Specifications

Specification	Details
Width	48.26 cm
Height	13.26 cm
Depth	35.56 cm
Operating Temperature	15 °C to 30 °C
Storage Temperature	-40 °C to 70 °C
Maximum Humidity	80% relative humidity from 10 °C to 35 °C

 

Compatible SWS System Components

System Component	Function
Tunable Laser Source	Generates the narrow-linewidth swept optical signal
Source Optics Module	Performs real-time wavelength measurements and source-side optical functions
Transmitter Cabinet	Houses compatible source and transmitter hardware
Receiver Control Module	Controls the receiver and communicates with the measurement system
Detector Module	Measures reference and device-under-test optical signals
Application Software	Controls measurements and calculates spectral component parameters
Computer Interface	Parallel-port connection or optional data acquisition hardware
User-Supplied Computer	Runs the SWS control and analysis software

 

Documented Optional System Add-Ons

Add-On Code	Description
01	Tunable laser source
03	Dual-waveband selector switch for C-band and L-band switching
04	Four-state polarization controller
06	Receiver control module for C-band and L-band operation
07	Two-channel receiver detector module
10	Two-channel receiver with software
15	Compact two-channel receiver
16	Parallel-port converter
17	L-band calibration kit with gas cell and HA9 attenuator
18	L-band gas cell for customer wavelength calibration

 

System Configuration Requirements

The SWS16102 is a source-side component of the SWS16100 platform and does not independently provide a complete swept-wavelength measurement solution. Compatible transmitter, receiver, detector, interface, software, and optical hardware are required.

The source module alone does not directly produce insertion-loss, bandwidth, center-wavelength, crosstalk, flatness, isolation, or PDL results. These measurements require the correct receiver channels, reference detector, device-under-test detector, system software, and calibration procedure.

If combined C-band and L-band measurements are required, the system must include compatible C-band and L-band source hardware together with the optional dual-waveband selector switch and appropriate receiver configuration.

Optical Setup and Referencing

The tunable laser, source optics module, receiver, detectors, and connected optical equipment should be allowed to stabilize before precision measurements begin.

All optical connectors should be inspected and cleaned before connection. Contaminated interfaces can produce wavelength-dependent insertion loss, reflection, instability, and spectral artifacts that may be incorrectly attributed to the device under test.

A reference sweep should be completed using the same source, optical path, detector configuration, software settings, wavelength range, and computer interface intended for the final measurement.

Optical fibers and connectors should remain mechanically stable after referencing. Moving or reconnecting fibers can alter the measured insertion loss and reduce the accuracy of comparative results.

Comprehensive Functional and Performance Testing

The JDS Uniphase SWS16102 receives comprehensive functional and performance testing before shipment. Evaluation may include AC power operation, startup, source-module controls, communication with compatible SWS hardware, and operation of both optical output paths.

Optical testing may include output continuity, relative output comparison, L-band sweep operation, source optics response, and performance at representative wavelengths within the documented 1541 nm to 1630 nm range.

The optical interfaces, connectors, front and rear panels, communication ports, power inlet, cooling system, enclosure, model label, and configuration markings may be inspected for contamination, damage, excessive wear, or mechanical problems.

The exact testing scope depends on the available SWS161 tunable laser, transmitter cabinet, source optics hardware, receiver chassis, detector modules, application software, computer interface, gas-cell reference, optical power meters, and compatible optical accessories.

Calibration Before Shipment

When technically applicable and selected, the JDS Uniphase SWS16102 can be calibrated or performance-verified before shipment as part of a compatible SWS16100 system. Evaluation may include wavelength sweep operation, absolute wavelength accuracy, wavelength resolution, optical output continuity, relative output level, and source optics functionality.

System-level calibration may use a compatible L-band gas cell and optical attenuator. Calibration documentation should identify the source module, tunable laser, receiver system, detector modules, software version, test wavelengths, reference hardware, recorded measurements, and applicable uncertainty.

Buyers requiring formal calibration should specify whether the SWS16102 source module or a complete SWS system must be evaluated, together with the required wavelength points, outputs, certificate format, recorded results, and measurement uncertainty.

Buyer Considerations

Buyers should confirm the complete model as JDS Uniphase SWS16102. The documented product structure identifies the SWS161 Series as an L-band platform and the 02 suffix as a dual-output configuration.

If the physical equipment is identified as C-band, the model label, tunable laser, installed source optics, measured wavelength range, and calibration records should be reviewed before the product is listed.

The product listing should identify whether the tunable laser, transmitter cabinet, receiver chassis, detector modules, source optics hardware, software, computer interface, optical cables, gas-cell calibration equipment, manuals, and calibration records are included.

Only the SWS16102 source module and accessories specifically identified in the product listing should be considered included.

Why Buy from AssetRelay?

AssetRelay supplies professional equipment and product solutions for fiber optic, telecom, laboratory, production, optical testing, photonics, electronic testing, RF/microwave, inspection, cleaning, and technical research applications. The JDS Uniphase SWS16102 supports DWDM component manufacturers, telecommunications laboratories, filter developers, fiber Bragg grating manufacturers, system integrators, universities, and research organizations requiring swept-wavelength L-band characterization.

Buyers should review the complete model label, documented L-band range, dual-output configuration, optical interface condition, tunable laser compatibility, receiver and detector requirements, software availability, calibration status, functional test results, and included system components before purchase.