
JDS · PS3650-25
JDSU PS3650 25 PDL Meter 1550 nm for Fiber Optic Component Testing
$6,392.00
Price in USD.
- Condition
- Used
- Availability
- In stock · 8 available
- Model
- PS3650-25
- Manufacturer
- JDS
- Category
- PDL Measurements
Description
JDSU PS3650 25 PDL Meter 1550 nm for Fiber Optic Component Testing: Precision Polarization Dependent Loss Measurement for Single-Mode Components
The JDSU PS3650 25 PDL Meter 1550 nm for Fiber Optic Component Testing is a polarization dependent loss (PDL) measurement instrument designed to characterize single-mode fiber-optic components at 1548 nm. Built around an internal laser source with SEIKOH-GIKEN FC/APC input and output connectors, it is aimed at optical component manufacturers, connector assembly houses, and R&D labs that need accurate PDL characterization along with insertion loss, return loss, and absolute power calibration in a single instrument.
Key Features and Benefits of the JDSU PS3650 25 PDL Meter 1550 nm for Fiber Optic Component Testing
- Internal 1548 nm laser source — Built-in calibrated source eliminates the need for an external laser for standard PDL measurements at the primary C-band test wavelength.
- Multi-wavelength PDL characterization — Panel detector calibrated for PDL at 1310 nm, 1480 nm, 1550 nm, and 1625 nm, covering the key single-mode telecom test wavelengths.
- Tight PDL stability — PDL stability vs. time within = 0.0040 dB at 1310 nm and = 0.0020 dB at 1550 nm, delivering repeatable measurements over long test sessions.
- High return loss test ports — Front panel "IN" port = 35.0 dB, front panel "OUT" port = 35.0 dB, minimizing internal reflection contribution to measurements.
- Absolute return loss calibration — Factory calibrated to 14.7 ±0.3 dB at both 1310 nm and 1550 nm for traceable RL reference.
- SEIKOH-GIKEN FC/APC connector interface — Angled polish at both input and output ports minimizes back reflections critical to accurate PDL and RL measurements.
- Amplifier linearity — Verified to ±0.02 dB per 1 dB step, ensuring accurate readings across the instrument's dynamic range.
- Loss through meter = 11.00 dB — Known insertion loss preserves measurement budget when the instrument is inline with other test hardware.
- Remote computer interface — RS232 and IEEE 488 (GPIB) support for integration into automated test systems.
Advanced Capabilities
The PS3650's PDL calibration structure is what distinguishes it from a general-purpose optical test set. PDL % accuracy is characterized at four telecom wavelengths — 1310 nm, 1480 nm, 1550 nm, and 1625 nm — with factory limits of = 1.50% at 1550 nm, = 2.00% at 1480 nm, = 3.00% at 1310 nm, and = 2.00% at 1625 nm. This multi-wavelength characterization means the instrument can be used across the full range of common single-mode component qualification tests without wavelength-mismatch errors creeping into results.
The PDL stability specifications are the other technical strength worth calling out. For small PDLs in the range of -20 to -55 dBm, PDL stability vs. power is bounded at < 0.0010 dB, and for large PDLs in the same power range, PDL stability vs. power is bounded at < 1.00%. These tight bounds mean the measured PDL number reflects the device under test rather than instrument drift, which is essential when qualifying low-PDL components like APC connectors and precision passive elements where PDL contributions are already small.
Calibration and Quality Assurance
Every JDSU PS3650 is calibrated prior to shipping to OEM specifications. The order includes a Calibration Certificate, Calibration Label, and full Calibration Data. This means the instrument arrives traceable, audit-ready, and ready to use straight out of the box — no need to schedule a calibration cycle before putting it into service.
Specifications
| Specification | Factory Limit |
|---|---|
| Model | PS3650 |
| Internal Laser Source Wavelength | 1548 nm |
| Input Connector Type | SEIKOH-GIKEN FC/APC |
| Output Connector Type | SEIKOH-GIKEN FC/APC |
| Absolute Power Calibration (after calibration factor adjustment) @ 1550 nm | ± 0.020 dB |
| Absolute Power Calibration (after calibration factor adjustment) @ 1310 nm | ± 0.020 dB |
| Amplifier Linearity | ± 0.02 dB per 1 dB step |
| Loss Through Meter | = 11.00 dB |
| Return Loss — Front Panel "IN" Port | = 35.0 dB |
| Return Loss — Front Panel "OUT" Port | = 35.0 dB |
| Output From Internal Source (PWR Mode) | = -20.00 dBm |
| Output From Internal Source (RL Mode) | = -17.00 dBm |
| PDL Stability vs. Time @ 1310 nm | = 0.0040 dB |
| PDL Stability vs. Time @ 1550 nm | = 0.0020 dB |
| Lav (Average Loss) Stability vs. Time @ 1310 nm | = 0.0500 dB |
| Lav (Average Loss) Stability vs. Time @ 1550 nm | = 0.0500 dB |
| PDL Stability vs. Power (small PDLs, -20 to -55 dBm) | < 0.0010 dB |
| PDL Stability vs. Power (large PDLs, -20 to -55 dBm) | < 1.00% |
| Panel Detector PDL @ 1550 nm | = 0.0020 dB |
| Panel Detector PDL @ 1480 nm | = 0.0030 dB |
| Panel Detector PDL @ 1310 nm | = 0.0040 dB |
| Panel Detector PDL @ 1625 nm | = 0.0030 dB |
| PDL % Accuracy @ 1550 nm | = 1.50% |
| PDL % Accuracy @ 1480 nm | = 2.00% |
| PDL % Accuracy @ 1310 nm | = 3.00% |
| PDL % Accuracy @ 1625 nm | = 2.00% |
| Absolute Return Loss Calibration @ 1550 nm | 14.7 ± 0.3 dB |
| Absolute Return Loss Calibration @ 1310 nm | 14.7 ± 0.3 dB |
| Return Loss Accuracy Check (RL measurements = 62 dB) | = 0.4 dB |
| Return Loss Accuracy Check (RL measurements > 62 dB) | = 0.9 dB |
| Absolute Power Accuracy Standard Specification | +/- 0.25 dB typical @ -10 dBm |
| Computer Remote Interface | RS232 and IEEE 488 (GPIB) |
