JDSU TB9223-Z-FA C+L-Band Tunable Grating Filter, 1525–1625 nm, FC/APC

JDS · TB9223-Z-FA

JDSU TB9223-Z-FA C+L-Band Tunable Grating Filter, 1525–1625 nm, FC/APC

$2,552.00

Price in USD.

Condition
Used
Availability
In stock · 2 available
Model
TB9223-Z-FA
Manufacturer
JDS
Category
Tunable Filters

Description

JDSU TB9223-Z-FA C+L-Band Tunable Grating Filter, 1525–1625 nm, FC/APC

The JDSU TB9223-Z-FA is a programmable diffraction grating filter designed for high-performance laboratory and production testing of single-mode fiber optic components and subsystems. It provides wavelength-selective filtering for isolating a desired optical signal while suppressing amplified spontaneous emission, broadband optical noise, and unwanted spectral content from laser sources.

The TB9223-Z-FA is the C+L-band version of the TB9223 filter. This configuration provides specified optical performance from 1525 nm to 1625 nm and uses FC/APC optical connectivity. The instrument provides a nominal -3 dB bandwidth of 0.6 nm, a nominal -20 dB bandwidth of 1.5 nm, and wavelength adjustment with 0.02 nm resolution.

The filter can be controlled locally through its front-panel keypad or remotely through GPIB and RS232 interfaces. These control options allow the TB9223-Z-FA to be used as a standalone laboratory filter or integrated into an automated optical test system with compatible tunable lasers, optical power meters, spectrum analyzers, optical switches, and other test equipment.

Features and Benefits of the JDSU TB9223-Z-FA

The JDSU TB9223-Z-FA provides wavelength-selective filtering for engineers, laboratories, production facilities, and service organizations working with C-band and L-band optical systems.

  • C+L-band optical performance: Provides specified filter performance from 1525 nm to 1625 nm.
  • Grating-based filter design: Uses a programmable diffraction grating to provide strong wavelength isolation and a narrow optical passband.
  • 0.6 nm nominal -3 dB bandwidth: Supports selective filtering of optical channels and laser signals.
  • 1.5 nm nominal -20 dB bandwidth: Helps reject unwanted optical power surrounding the selected passband.
  • 0.02 nm wavelength resolution: Supports fine adjustment of the filter wavelength.
  • Single-mode optical path: Uses single-mode fiber at the optical input and output.
  • FC/APC optical connectivity: Supports compatible angled-contact FC patch cords for reduced connector backreflection.
  • High return loss: Provides return loss greater than 45 dB.
  • Front-panel operation: Allows direct wavelength selection and instrument control from the integrated keypad.
  • Automated test integration: Includes GPIB and RS232 interfaces for remote control.
  • Laboratory and production use: Supports research, engineering, quality-control, and automated manufacturing workflows.

C+L-Band Optical Filtering

The TB9223-Z-FA is designed for optical filtering across wavelengths from 1525 nm to 1625 nm. This range covers the conventional C-band and extends through the L-band region used by optical amplifiers, DWDM systems, tunable lasers, filters, and wavelength-selective communication components.

The broad specified range allows one instrument to support measurements across numerous optical channels without exchanging fixed filters. Users can tune the passband to the required wavelength and evaluate devices throughout the available C+L-band range.

This wide-range configuration should not be confused with the standard TB9223 C-band configuration. The TB9223-Z-FA provides documented insertion-loss and polarization-dependent-loss performance across 1525 nm to 1625 nm.

Grating-Based Wavelength Selection

The JDSU TB9 Series uses a diffraction grating to select a narrow spectral region while rejecting wavelengths outside the desired passband. The grating architecture provides a sharper wavelength-isolation roll-off than conventional Fabry-Perot etalons or interference filters.

The TB9223-Z-FA provides a nominal -3 dB bandwidth of 0.6 nm and a nominal -20 dB bandwidth of 1.5 nm. Both bandwidth values have a tolerance of ±15%.

This optical response is useful for separating a selected laser wavelength from broadband source content, reducing amplified spontaneous emission, isolating optical channels, and improving the spectral definition of signals used for component testing.

Amplified Spontaneous Emission Filtering

The JDSU TB9223-Z-FA can be used for amplified spontaneous emission filtering in erbium-doped fiber amplifier applications. EDFAs can generate broadband ASE in addition to the desired amplified signal, increasing optical noise and affecting wavelength-selective measurements.

The filter can be tuned to pass the required wavelength while rejecting a substantial portion of the surrounding ASE. This supports amplifier characterization, gain testing, wavelength-dependent analysis, source cleanup, and evaluation of components positioned after an optical amplifier.

The broad C+L-band range makes the instrument suitable for amplifier systems that operate beyond the conventional C-band. Source power, insertion loss, polarization-dependent loss, and detector sensitivity should be considered when configuring the complete setup.

Spontaneous-Emission Suppression

The TB9223-Z-FA can suppress spontaneous emission from distributed feedback lasers and tunable laser sources. A laser may produce the desired narrow optical carrier together with lower-level optical energy outside the primary wavelength.

By tuning the filter to the laser wavelength, users can reduce unwanted spectral content before the signal reaches a wavelength-selective component, optical receiver, power detector, or other device under test.

For tunable-laser-based measurements, remote control can coordinate the filter wavelength with the laser source. This supports automated wavelength sweeps and channel-based measurements across the C+L-band range.

WDM and DWDM Component Testing

The JDSU TB9223-Z-FA is suitable for wavelength-selective testing of WDM and DWDM components. The filter can isolate a desired optical channel before or after a device under test.

Typical devices may include optical filters, multiplexers, demultiplexers, wavelength-selective switches, couplers, fiber Bragg gratings, arrayed waveguide gratings, optical amplifiers, and other active or passive photonic components.

The filter can be coordinated with a compatible tunable laser, optical power meter, optical spectrum analyzer, optical switch, or variable optical attenuator. This supports wavelength sweeps, channel-by-channel measurements, insertion-loss testing, passband evaluation, and spectral-rejection analysis.

Typical Applications

The JDSU TB9223-Z-FA Tunable Grating Filter is suitable for professional applications such as:

  • C+L-band wavelength-selective filtering
  • Amplified spontaneous emission filtering
  • EDFA characterization and testing
  • Spontaneous-emission suppression
  • DFB laser source cleanup
  • Tunable laser testing
  • WDM and DWDM component characterization
  • Optical filter evaluation
  • MUX and DEMUX testing
  • Fiber Bragg grating measurements
  • Arrayed waveguide grating testing
  • Automated laboratory and production testing

Product Overview

Brand JDSU / JDS Uniphase
Model TB9223-Z-FA
Product Family TB9 Series Tunable Grating Filters
Base Filter Model TB9223
Product Category Programmable Single-Mode Tunable Grating Filter
Wavelength Configuration C+L-band
Specified Optical Range 1525 nm to 1625 nm
Fiber Configuration Single-mode fiber input and output
Connector Type FC/APC
Primary Application Wavelength-selective filtering across the C+L-band range

 

TB9223-Z-FA Optical Specifications

Specification Details
Specified Optical Range 1525 nm to 1625 nm
Nominal -3 dB Bandwidth 0.6 nm
-3 dB Bandwidth Tolerance ±15%
Nominal -20 dB Bandwidth 1.5 nm
-20 dB Bandwidth Tolerance ±15%
Insertion Loss 7.0 dB or less
Polarization-Dependent Loss 0.5 dB or less
Wavelength Resolution 0.02 nm
Return Loss Greater than 45 dB
Wavelength Repeatability 0.05 nm
Wavelength Accuracy 0.2 nm

 

Configuration Details

Configuration Field Selected Configuration
Base Model TB9223
Wide-Range Designation Z
Optical Range 1525 nm to 1625 nm C+L-band configuration
Connector Code FA
Connector Type FC/APC

 

Control and Automation Interfaces

Control Method Details
Local Control Front-panel keypad
Parallel Remote Interface GPIB
Serial Remote Interface RS232
Automation Application Remote wavelength selection and coordination with compatible optical test equipment

 

Electrical, Environmental, and Mechanical Specifications

Specification Details
Input Voltage 100 V AC to 240 V AC
Line Frequency 50 Hz to 60 Hz
Maximum Power Consumption 80 VA
Dimensions 21.2 cm wide x 8.9 cm high x 35.5 cm deep
Rack Format 19-inch rack compatible, 2U high, half-rack width
Weight 4 kg
Operating Temperature 10 °C to 40 °C
Storage Temperature 0 °C to 50 °C
Humidity Maximum 95% relative humidity up to 40 °C, decreasing by 5% per °C from 40 °C to 50 °C

 

FC/APC Optical Interface

The TB9223-Z-FA uses an FC/APC optical interface. Compatible single-mode FC/APC patch cords should be used for connection to the filter.

FC/APC and FC/PC connectors use different end-face geometries and should not be mated directly. The angled-contact interface should be connected only to compatible FC/APC cables and adapters.

All optical connector end faces should be inspected and cleaned before mating. Contamination can increase insertion loss, reduce return loss, introduce measurement instability, and affect the filter response.

Measurement Preparation

The filter should be allowed to stabilize before measurements requiring its documented wavelength accuracy and repeatability. The desired wavelength should be selected through the front-panel keypad or remote interface before optical power is applied.

The filter should be connected using clean, compatible single-mode FC/APC patch cords. Fiber movement, connector contamination, polarization changes, source drift, and temperature variation can affect insertion loss and measurement repeatability.

The complete test setup should be evaluated for optical source power, connector compatibility, filter insertion loss, detector sensitivity, and device-under-test limits before operation.

Calibration and Testing Before Shipment

When calibration is technically applicable and supported, the JDSU TB9223-Z-FA is calibrated before shipment. The calibration process may include verification of wavelength accuracy, wavelength repeatability, tuning resolution, passband width, insertion loss, polarization-dependent loss, front-panel operation, and remote-interface control.

Following successful calibration, the instrument may include a calibration label, calibration certificate, and related calibration data, depending on the equipment configuration and calibration service.

If formal calibration is unavailable or not applicable to the specific instrument, the unit receives comprehensive functional and performance testing. This process may include wavelength tuning across the available C+L-band range, optical transmission checks, filter-response evaluation, connector inspection, keypad operation, display functions, GPIB communication, and RS232 control.

This testing helps verify that the equipment operates correctly and that its available functions have been evaluated before it is released for shipment. The exact calibration scope, documentation, test data, and service records should be confirmed before purchase when these items are required for laboratory, production, regulatory, or quality-management applications.

Buyer Considerations

The JDSU TB9223-Z-FA is a configuration-specific C+L-band tunable grating filter. Buyers should confirm that the 1525 nm to 1625 nm specified optical range, 0.6 nm nominal passband, FC/APC interface, insertion loss, and polarization-dependent-loss performance match the