JDSU PS3650-AT1 Polarization Dependent Loss PDL Meter 1550nm with Attenuator

JDSU PS3650-AT1 Polarization Dependent Loss PDL Meter 1550nm with Attenuator: Integrated PDL, Insertion Loss, and Attenuation for Single-Mode Component Testing

The JDSU PS3650-AT1 Polarization Dependent Loss PDL Meter 1550nm with Attenuator is a variant of the PS3650 PDL meter that adds an integrated optical attenuator to the base PDL, insertion loss, and return loss measurement capability at 1548 nm. Built around an internal laser source with SEIKOH-GIKEN FC/APC input and output connectors, it is aimed at optical component manufacturers, connector assembly houses, and R&D labs that need PDL characterization together with programmable attenuation in a single instrument.

Key Features and Benefits of the JDSU PS3650-AT1 Polarization Dependent Loss PDL Meter 1550nm with Attenuator

• Integrated attenuator (AT1 option) — Built-in optical attenuator eliminates the need for a separate inline attenuator during PDL and loss testing, reducing patch cord count and connector wear.
• Internal 1548 nm laser source — Built-in calibrated source eliminates the need for an external laser for standard PDL measurements at the primary C-band test wavelength.
• Multi-wavelength PDL characterization — Panel detector calibrated for PDL at 1310 nm, 1480 nm, 1550 nm, and 1625 nm, covering the key single-mode telecom test wavelengths.
• Tight PDL stability — PDL stability vs. time within = 0.0040 dB at 1310 nm and = 0.0020 dB at 1550 nm, delivering repeatable measurements over long test sessions.
• High return loss test ports — Front panel "IN" port = 35.0 dB, front panel "OUT" port = 35.0 dB, minimizing internal reflection contribution to measurements.
• Absolute return loss calibration — Factory calibrated to 14.7 ±0.3 dB at both 1310 nm and 1550 nm for traceable RL reference.
• SEIKOH-GIKEN FC/APC connector interface — Angled polish at both input and output ports minimizes back reflections critical to accurate PDL and RL measurements.
• Amplifier linearity — Verified to ±0.02 dB per 1 dB step, ensuring accurate readings across the instrument's dynamic range.
• Remote computer interface — RS232 and IEEE 488 (GPIB) support for integration into automated test systems.

Advanced Capabilities

The PS3650-AT1's PDL calibration structure distinguishes it from a general-purpose optical test set. PDL % accuracy is characterized at four telecom wavelengths — 1310 nm, 1480 nm, 1550 nm, and 1625 nm — with factory limits of = 1.50% at 1550 nm, = 2.00% at 1480 nm, = 3.00% at 1310 nm, and = 2.00% at 1625 nm. This multi-wavelength characterization means the instrument can be used across the full range of common single-mode component qualification tests without wavelength-mismatch errors creeping into results.

The PDL stability specifications are the other technical strength worth calling out. For small PDLs in the range of -20 to -55 dBm, PDL stability vs. power is bounded at < 0.0010 dB, and for large PDLs in the same power range, PDL stability vs. power is bounded at < 1.00%. These tight bounds mean the measured PDL number reflects the device under test rather than instrument drift, which is essential when qualifying low-PDL components where PDL contributions are already small. The AT1 attenuator option extends this capability by allowing users to set precise optical power levels at the DUT without an external attenuator in the path.

Calibration and Quality Assurance

Every JDSU PS3650-AT1 is calibrated prior to shipping to OEM specifications. The order includes a Calibration Certificate, Calibration Label, and full Calibration Data. This means the instrument arrives traceable, audit-ready, and ready to use straight out of the box — no need to schedule a calibration cycle before putting it into service.

Specifications

Specification	Factory Limit
Model	PS3650-AT1 (PS3650 base with integrated attenuator)
Internal Laser Source Wavelength	1548 nm
Input Connector Type	SEIKOH-GIKEN FC/APC
Output Connector Type	SEIKOH-GIKEN FC/APC
Absolute Power Calibration @ 1550 nm	± 0.020 dB
Absolute Power Calibration @ 1310 nm	± 0.020 dB
Amplifier Linearity	± 0.02 dB per 1 dB step
Loss Through Meter	= 11.00 dB
Return Loss — Front Panel "IN" Port	= 35.0 dB
Return Loss — Front Panel "OUT" Port	= 35.0 dB
Output From Internal Source (PWR Mode)	= -20.00 dBm
Output From Internal Source (RL Mode)	= -17.00 dBm
PDL Stability vs. Time @ 1310 nm	= 0.0040 dB
PDL Stability vs. Time @ 1550 nm	= 0.0020 dB
Lav (Average Loss) Stability vs. Time @ 1310 nm	= 0.0500 dB
Lav (Average Loss) Stability vs. Time @ 1550 nm	= 0.0500 dB
PDL Stability vs. Power (small PDLs, -20 to -55 dBm)	< 0.0010 dB
PDL Stability vs. Power (large PDLs, -20 to -55 dBm)	< 1.00%
Panel Detector PDL @ 1550 nm	= 0.0020 dB
Panel Detector PDL @ 1480 nm	= 0.0030 dB
Panel Detector PDL @ 1310 nm	= 0.0040 dB
Panel Detector PDL @ 1625 nm	= 0.0030 dB
PDL % Accuracy @ 1550 nm	= 1.50%
PDL % Accuracy @ 1480 nm	= 2.00%
PDL % Accuracy @ 1310 nm	= 3.00%
PDL % Accuracy @ 1625 nm	= 2.00%
Absolute Return Loss Calibration @ 1550 nm	14.7 ± 0.3 dB
Absolute Return Loss Calibration @ 1310 nm	14.7 ± 0.3 dB
Return Loss Accuracy Check (RL = 62 dB)	= 0.4 dB
Return Loss Accuracy Check (RL > 62 dB)	= 0.9 dB
Absolute Power Accuracy Standard Specification	+/- 0.25 dB typical @ -10 dBm
Computer Remote Interface	RS232 and IEEE 488 (GPIB)